• Microscopia eletrônica de varredura: aspectos instrumentais 

      Santos, Maria Júlia dos (Universidade Federal de São Carlos, UFSCar, , Câmpus São Carlos, 29/01/2024)
      Scanning electron microscopy (SEM) arose from the need to characterize materials on the nanometer scale, considering that until then, optical microscopes could only achieve resolutions of the order of micrometers. Since ...