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Electromigration of multiterminal transport bridges
(Universidade Federal de São Carlos, UFSCar, Programa de Pós-Graduação em Física - PPGF, Câmpus São Carlos, 09/03/2023)With the continued miniaturization of integrated circuits (ICs), the case of metallic tracks subjected to stress caused by transport currents has become a matter of increasing concern, as it puts at risk the reliability ...