Prospecção tecnológica em materiais: aumento da eficiência do tratamento bibliométrico. Aplicação na análise de tratamentos de superfície resistentes ao desgaste.
Visualizar/ Abrir
Data
2001-12-07Autor
Faria, Leandro Innocentini Lopes de
Metadata
Mostrar registro completoResumo
Nowadays, there is a wide information bulk in accelerated increase that
needs high efficiency of analysis to the decision maker. Databases spreading
become more important the production of indicators to technological forecasting
by using automated bibliometric analysis. Although, the most databases aren t
structured for this goal. In this way, it becomes fundamental the data
preparation considering the technologies studied, the features of database used
and of information retrieved, besides of the programming technologies.
In this work, it was developed solutions to increase the efficiency of
bibliometric analysis from essential databases in materials science and
technology. New solution was developed to the Metadex database that allowed
automatic grouping of processes, properties, factors that can influence
properties and processes and shape of materials. Also, it was created a new
database contained more than 30 millions of restructured records from Web of
Science, inserting all the cited authors besides the first (the only one available),
classification inserting, improvement of data retrieval and others. Study
complementary was developed to improve the Derwent Innovation Index that
improved the technological study of different countries.
The methods were applied to the forecasting study of hermetic
compressor surface treatments. It was possible to create and analyze indicators
of the main surface treatment technologies to decrease wear, relations between
applications and coatings types, among R&D fields, countries, institutions,
companies and renowned researches. Also, the developed methods can be
adaptable to as other databases as other technological forecasting studies like
materials field or other technological and scientific knowledge fields.